Japan / US · Chips & Networking
Chip Testing & Burn-in
Bigger dies, more chiplets and HBM stacks multiply test time. SoC and memory testers become a quiet throughput gate for every accelerator shipped.
Wafer probe→Final test→Burn-in→Ship
70
Tightness score ⓘ
#22 of 56
▲ Tightening
Lead time
6–12 mo
Theme 1M
−29.4%% in uptrend
20%Metric to watch
Advantest and Teradyne SoC-test orders, test time per device, and burn-in commentary.
What would prove us wrong
Weakens if tester lead times shorten while accelerator unit volumes rise.
Test theme performance
Equal-weight · rebased 100 · 1YStocks we track
Who controls this bottleneck
Roles, not recommendations. Delayed prices; local currency.
| Stock | Role | Listing | Last | 1D | 1M | 3M | YTD | Off 52w high | Trend | Next earnings |
|---|---|---|---|---|---|---|---|---|---|---|
| 6857.T Advantest |
SoC and memory testers for AI accelerators and HBM | TSE Japan |
¥34,860 | −5.86% | +1.8% | +36.9% | +78.0% | −16.7% | 2027-01-27 | |
| TER Teradyne |
SoC test plus Universal Robots cobots | NASDAQ US |
$274.4 | −7.38% | −34.0% | −25.0% | +41.9% | −43.3% | 2027-01-27 | |
| FORM FormFactor |
Probe cards incl. HBM wafer probe | NASDAQ US |
$87.53 | −10.19% | −41.0% | −19.6% | +56.9% | −45.3% | 2026-10-28 | |
| AEHR Aehr Test Systems |
Wafer-level burn-in | NASDAQ US |
$54.89 | −10.33% | −46.0% | −40.1% | +171.9% | −62.3% | 2026-11-02 | |
| COHU Cohu |
Test handlers and interface | NASDAQ US |
$50.79 | −4.89% | −27.8% | +4.0% | +118.3% | −31.3% | 2026-10-28 |